|
Myron Hecht, Yutao He, Herbert Hecht, and Xuegao An, Integration of System
Dependability and Software Reliability Growth Models for E-Commerce Systems, High
Assurance System Engineering Conference, Albuquerque, NM, November, 2000
This paper describes how MEADEP [SoHaR00], a system level dependability prediction
tool, and SMERFS [Farr93], a software reliability growth prediction tool can be
used together to predict system reliability, and availability growth) for complex
systems. The Littlewood/ Verrall model is used to predict reliability growth from
software test data. This prediction is integrated into a system level Markov model
that incorporates WAN (Internet) service interruptions, hardware failures and recoveries,
redundancy, coverage failures, and capacity. The results of the combined model can
be used to predict the contribution of additional testing upon availability, the
economic value of additional testing, and a variety of other figures of merit that
support management decisions.
Click to Download
|
|
